发明名称 SAMPLE INTRODUCTION METHOD, SAMPLE STAGE, AND CHARGED PARTICLE BEAM DEVICE
摘要 The sample introduction method for introducing a sample that contains moisture into a sample chamber of a charged particle beam device comprises: a step (S100) for mounting the sample onto a sample holding part; a step (S102) for covering a predetermined region of the sample with a moisture-retaining material; a step (S104) for evacuating the sample chamber housing the sample whereof the predetermined region has been covered with the moisture-retaining material; and a step (S106) for exposing the predetermined region covered with the moisture-retaining material.
申请公布号 WO2015198968(A1) 申请公布日期 2015.12.30
申请号 WO2015JP67646 申请日期 2015.06.18
申请人 JEOL LTD. 发明人 INOUE, NORIYUKI;TAKASHIMA, YOSHIKO
分类号 H01J37/20;G01N1/28 主分类号 H01J37/20
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