发明名称 半導体装置の製造方法
摘要 <p>According to one embodiment, a manufacturing method of a semiconductor device comprises forming a to-be-processed film includes a convex potion and concave potion on its surface on a semiconductor substrate via layers having a relative dielectric constant smaller than that of SiO2, planarizing the surface of the to-be-processed film, and etching the planarized surface of the to-be-processed film.</p>
申请公布号 JP5836992(B2) 申请公布日期 2015.12.24
申请号 JP20130057178 申请日期 2013.03.19
申请人 株式会社東芝 发明人 松井 之輝;側瀬 聡文;南幅 学
分类号 H01L21/304;H01L21/3065 主分类号 H01L21/304
代理机构 代理人
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