发明名称 METHOD FOR ETCHING INSULATION FILM
摘要 Disclosed is a method for etching an insulation film of a processing target object. The method includes: in a first term, periodically switching ON and OFF of a high frequency power so as to excite a processing gas containing fluorocarbon and supplied into a processing container of a plasma processing apparatus; and in a second term subsequent to the first term, setting the high frequency power to be continuously turned ON so as to excite the processing gas supplied into the processing container. In one cycle consisting of a term where the high frequency is turned ON and a term where the high frequency power is turned OFF in the first term, the second term is longer than the term where the high frequency power is turned ON.
申请公布号 US2015371830(A1) 申请公布日期 2015.12.24
申请号 US201514730394 申请日期 2015.06.04
申请人 TOKYO ELECTRON LIMITED 发明人 TAKAHASHI Akira;NAKAYAMA Kei;IGARASHI Yoshiki;HIROTSU Shin
分类号 H01J37/32 主分类号 H01J37/32
代理机构 代理人
主权项 1. A method for etching an insulation film of a processing target object that includes a wiring layer, the insulation film formed on the wiring layer, and a mask formed of an organic film on the insulation film, the method comprising: in a first term, periodically switching ON and OFF of a high frequency power so as to excite a processing gas containing fluorocarbon and supplied into a processing container of a plasma processing apparatus; and in a second term subsequent to the first term, setting the high frequency power to be continuously turned ON so as to excite the processing gas supplied into the processing container, in which, in one cycle consisting of a term where the high frequency is turned ON and a term where the high frequency power is turned OFF in the first term, the second term is longer than the term where the high frequency power is turned ON, wherein the periodically switching ON and OFF of the high frequency power, and the setting the high frequency power to be continuously turned ON are alternately repeated.
地址 Tokyo JP