发明名称 MULTI-LEVEL DATA PATTERN GENERATION FOR I/O TESTING OF MULTILEVEL INTERFACES
摘要 One feature is a method of reading data from a plurality of pattern registers, generating a first output at a mapping register from the read data, generating a second output, different from the first output, at the mapping register from the read data, and generating a multi-level signal using the first and second outputs. In one embodiment, generating the first output is done by adding a first plurality of bits to a second plurality of bits, and generating the second output is done by adding the first plurality of bits to an inverse of the second plurality of bits.
申请公布号 WO2015103290(A3) 申请公布日期 2015.12.17
申请号 WO2014US72798 申请日期 2014.12.30
申请人 QUALCOMM INCORPORATED 发明人 HOLLIS, TIMOTHY MOWRY
分类号 G11C29/02;G06F11/263;G06F11/27;G11C29/12;G11C29/36 主分类号 G11C29/02
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