An Adjustable Specimen device for an Electron Microscope,申请号GB19680005547-传众专利搜索

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发明名称	An Adjustable Specimen device for an Electron Microscope
摘要
申请公布号	GB1161374(A)	申请公布日期	1969.08.13
申请号	GB19680005547	申请日期	1968.02.02
申请人	NIHON DENSHI KABUSHIKI KAISHA	发明人
分类号	G02B21/26;H01J37/20	主分类号	G02B21/26
代理机构		代理人
主权项
地址

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