| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection illumination method and inspection illumination device that enable an entire area of an inspection object surface to be uniformly irradiated with light from a light emission mechanism regardless of a shape of the inspection object surface.SOLUTION: An inspection illumination method of using a light emission mechanism having a light emission surface, and a lens arranged between a curve plane shape or irregular plane shape inspection object surface and the light emission mechanism is an inspection illumination method that is configured to irradiate the inspection object surface with light emitted from the light emission surface. A shape of the light emission surface is set so that each point of the light emission surface is respectively formed relative to each point of the inspection object surface by the lens. |
