发明名称 半導体装置
摘要 <p>A channel region having a first conductivity type is disposed in a surface portion of a semiconductor substrate. A gate region having a second conductivity type is disposed in a surface portion of the channel region. A first semiconductor region having the second conductivity type is disposed under the channel region. Source/drain regions having the first conductivity type are disposed in parts of the surface portion of the channel region on both sides of the gate region in a channel length direction. Second semiconductor regions each having a high impurity concentration and the second conductivity type are disposed in parts of the semiconductor substrate on both sides of the channel region in a channel width direction.</p>
申请公布号 JP5834200(B2) 申请公布日期 2015.12.16
申请号 JP20120519208 申请日期 2011.02.24
申请人 パナソニックIPマネジメント株式会社 发明人 大岡 正人;松井 靖;辻野 秀治
分类号 H01L21/337;H01L21/331;H01L21/8222;H01L21/8248;H01L27/06;H01L27/095;H01L27/098;H01L29/732;H01L29/808 主分类号 H01L21/337
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