发明名称 |
Probe for Electrical Test and Probe Assembly |
摘要 |
A probe for electrical test provided with positioning marks parallel to a plane where tips are provided and at a height position lower than the plane on a plane directed in the same direction as the plane, the positioning marks are in a predetermined positional relation to said tips. The positioning marks contain information indicating an existing direction of the tips when the positioning marks are observed from the projecting direction of the tips.
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申请公布号 |
US2009009201(A1) |
申请公布日期 |
2009.01.08 |
申请号 |
US20060160199 |
申请日期 |
2006.03.15 |
申请人 |
KABUSHIKI KAISHA NIHON MICRONICS |
发明人 |
MIYAGI YUJI;IWABUCHI TETSUYA |
分类号 |
G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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