发明名称 METHOD OF FORMING A FERROELECTRIC LAYER AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME
摘要 PURPOSE: A method for forming a ferroelectric thin film and a semiconductor device manufacturing method using the same are provided to flatten only rough portion of the ferroelectric thin film while suppressing the abrasion of bulk portion of the ferroelectric thin film by using slurry composition. CONSTITUTION: A conductive structure is formed on a substrate(S110). A pre ferroelectric film is formed on the conductive structure(S120). The surface of the pre ferroelectric film is chemically-mechanically polished using slurry composition(S130). A ferroelectric film with improved surface roughness is washed(S140). The ferroelectric film is heat-treated to cure the damage of the film surface(S150).
申请公布号 KR20100009013(A) 申请公布日期 2010.01.27
申请号 KR20080069681 申请日期 2008.07.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SUK HUN;LEE, JONG WON;HONG, CHANG KI;YOON, BO UN
分类号 H01L21/31;H01L27/105 主分类号 H01L21/31
代理机构 代理人
主权项
地址