发明名称 WET CLEANING EQUIPMINT OF WAFER
摘要 <p>A wet cleaning device of a wafer is provided to reduce a cost by commonly using a wafer cassette separating unit, a wafer cassette coupling unit, a wafer cassette loading unit, and a wafer cassette unloading unit. A wafer cassette loading unit(110) transfers a cassette to a wafer cassette transferring robot. A wafer cassette separating unit(120) separates the cassette mounting the wafer to the wafer and the cassette. An SPM(Sulfuric Acid Peroxide Mixture) bath(130) removes the photoresist from the wafer. A C/C(Chuck Clean) bath(140) cleans a chuck of a first wafer transferring robot. An HQDR(Hot Quick Dump Rinse) bath(150) cleans the wafer. An APR(Ammonium Peroxide Replacement) bath(160) cleans the particle and the organic compound of the wafer. A drier(170) dries the wet-cleaned wafer. A wafer cassette coupling unit(180) couples the wafer with the cassette. A wafer cassette unloading unit(190) unloads the cassette combined with the wafer.</p>
申请公布号 KR20090063845(A) 申请公布日期 2009.06.18
申请号 KR20070131355 申请日期 2007.12.14
申请人 DONGBU HITEK CO., LTD. 发明人 CHO, IN BAE
分类号 H01L21/304;H01L21/02;H01L21/677 主分类号 H01L21/304
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