发明名称 TEST APPARATUS, SKEW MEASURING APPARATUS, DEVICE AND BOARD
摘要 There is provided a test apparatus for testing a device under test, which includes a plurality of drivers which output signals to the device under test, an output control section which controls the plurality of drivers to output a plurality of signals respectively, a calculating section which calculates skews of the plurality of signals output from the plurality of drivers respectively, based on a combination signal obtained by combining the plurality of signals, and an adjusting section which adjusts the timings to output signals to be output from the plurality of drivers, based on the skews.
申请公布号 US2009105977(A1) 申请公布日期 2009.04.23
申请号 US20070947786 申请日期 2007.11.30
申请人 ADVANTEST CORPORATION 发明人 FURUKAWA YASUO;ASAMI KOJI
分类号 G06F19/00;G01R29/26;G01R31/28 主分类号 G06F19/00
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