发明名称 TEMPERATURE TEST DEVICE, AND TEMPERATURE TEST METHOD
摘要 PROBLEM TO BE SOLVED: To provide a temperature test device of performing test by increasing only the temperature of an atmosphere in the vicinity of a module of a test object of electronic equipment. SOLUTION: The temperature test device has: a casing provided with a blowing route between a suction inlet and an exhaust outlet; a first blower arranged in the neighborhood of the suction inlet; a second blower arranged in the neighborhood of the exhaust outlet; a test means for performing evaluation test to the test object module arranged at a position neared to the first flower in the casing; and a heat source device for giving heat air to the first blower of the test means. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009047600(A) 申请公布日期 2009.03.05
申请号 JP20070215003 申请日期 2007.08.21
申请人 FUJITSU LTD 发明人 SONE SHUNSUKE;YAMANISHI HIROKAZU
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址