发明名称 IN-CIRCUIT TESTER
摘要 PROBLEM TO BE SOLVED: To reliably detect a pseudo-contact between a print circuit board and a substrate part 2x mounted on the print circuit board, a crack in the substrate part 2x and the like in an in-circuit tester 1 performing an open test for a print substrate 2 either from the front or back side. SOLUTION: The open test is performed by disposing pressing members on an opposite side of the test face of the print substrate 2 and by warping the print substrate 2 by pressing with the pressing members 6d-6f. Further, the pressing members 6d-6f are made so that the pressure is independently controllable. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009047437(A) 申请公布日期 2009.03.05
申请号 JP20070210939 申请日期 2007.08.13
申请人 OKI ELECTRIC IND CO LTD 发明人 YOSHIDA AKIO
分类号 G01R31/04;H05K3/00 主分类号 G01R31/04
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