发明名称 CALIBRATION CIRCUIT FOR ON DIE TERMINATION DEVICE
摘要 A calibration circuit of an on die termination device is provided to change a calibration code by controlling a level of a reference voltage by a control signal. A reference voltage generating part(310) outputs a reference voltage in response to one or more control signal. A code generating part(320) generates one or more calibration code in response to the reference voltage and a voltage of one or more calibration node, and includes a comparator, a counter, and a calibration resistance part. The comparator(321) compares the calibration node with the reference voltage. The counter(322) counts the calibration code according to a compared result of the comparator. The calibration resistance part(323) is connected to the calibration node. A resistance value of the calibration resistance part is determined by an inputted calibration code.
申请公布号 KR20090022043(A) 申请公布日期 2009.03.04
申请号 KR20070087069 申请日期 2007.08.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YUN, TAE SIK
分类号 G11C7/10;G11C5/14 主分类号 G11C7/10
代理机构 代理人
主权项
地址