发明名称 |
Optical interrogation system and microplate position correction method |
摘要 |
An optical interrogation system and method are described herein that are capable of detecting and correcting a positional misalignment of a label independent detection (LID) microplate so that the LID microplate can be properly interrogated after being removed from and then re-inserted back into a microplate holder/XY translation stage. |
申请公布号 |
US2009027693(A1) |
申请公布日期 |
2009.01.29 |
申请号 |
US20070900315 |
申请日期 |
2007.09.11 |
申请人 |
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发明人 |
DAILEY, JR. MICHAEL J.;PIECH GARRETT A.;SHEDD GORDON M.;WEBB MICHAEL B.;ZAMBRANO ELVIS A. |
分类号 |
G01B11/14 |
主分类号 |
G01B11/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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