发明名称 PATTERN GENERATING APPARATUS AND APPARATUS FOR MEASURING PHYSICAL PROPERTY OF SURFACE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and a pattern generating apparatus for writing a pattern on a surface of an object that is independent of any physical deformation that will occur upon writing a pattern. <P>SOLUTION: The present invention relates to a method for writing a pattern on a surface of an object intended for use in an exposure apparatus, including steps of: placing an object having a thickness T being provided with a surface on a stage of the pattern generating apparatus; dividing the surface into a number of measurement points, where two adjacent measurement points being spaced a distance apart not exceeding a predetermined maximum distance P; measuring the gradient of the surface at each measurement point; calculating a two-dimensional local offset d in the x-y plane for each measurement point as a function of the gradient and the thickness T of the object; and correcting the pattern to be written on the surface by using the two-dimensional local offset d. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009020523(A) 申请公布日期 2009.01.29
申请号 JP20080201577 申请日期 2008.08.05
申请人 MICRONIC LASER SYST AB 发明人 STIBLERT LARS;EKBERG PETER
分类号 G03F7/20;B41J2/00;B41J2/435;G01B11/24;G01B11/30;G01B21/04;G01B21/30;G03F1/08 主分类号 G03F7/20
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