发明名称 |
FAULT TOLERANT ASYNCHRONOUS CIRCUITS |
摘要 |
New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits.
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申请公布号 |
US2009027078(A1) |
申请公布日期 |
2009.01.29 |
申请号 |
US20080240430 |
申请日期 |
2008.09.29 |
申请人 |
MANOHAR RAJIT;KELLY CLINTON W |
发明人 |
MANOHAR RAJIT;KELLY CLINTON W. |
分类号 |
H03K19/003;H01S4/00;H03K3/00 |
主分类号 |
H03K19/003 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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