发明名称 METHOD FOR MANUFACTURING SOI SUBSTRATE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide: a method for manufacturing an SOI substrate with favorable adherence without high-temperature heat treatment being performed in bonding; a semiconductor device using the SOI substrate: and a manufacturing method thereof. <P>SOLUTION: The SOI substrate and semiconductor device can be manufactured by forming a single-crystalline silicon substrate with a thickness of 50μm or less in which an ion implanted layer is formed; forming a substrate having an insulating layer over a surface; activating at least one of the surfaces of the single-crystalline silicon substrate and the insulating layer by exposure to a plasma atmosphere or an ion atmosphere; and bonding the single-crystalline silicon substrate and the substrate with the insulating layer interposed therebetween. Here, a silicon oxide layer formed by chemical vapor deposition using silane-based gas can be used as the insulating layer. Further, a laminated film of the silicon oxide layer formed by the chemical vapor deposition using silane-based gas and a nitrogen-containing layer may be used as the insulating layer. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009004741(A) 申请公布日期 2009.01.08
申请号 JP20080107747 申请日期 2008.04.17
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;ONUMA HIDETO
分类号 H01L21/02;H01L21/336;H01L21/762;H01L27/12;H01L29/786 主分类号 H01L21/02
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