发明名称 |
METHOD FOR MANUFACTURING SOI SUBSTRATE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide: a method for manufacturing an SOI substrate with favorable adherence without high-temperature heat treatment being performed in bonding; a semiconductor device using the SOI substrate: and a manufacturing method thereof. <P>SOLUTION: The SOI substrate and semiconductor device can be manufactured by forming a single-crystalline silicon substrate with a thickness of 50μm or less in which an ion implanted layer is formed; forming a substrate having an insulating layer over a surface; activating at least one of the surfaces of the single-crystalline silicon substrate and the insulating layer by exposure to a plasma atmosphere or an ion atmosphere; and bonding the single-crystalline silicon substrate and the substrate with the insulating layer interposed therebetween. Here, a silicon oxide layer formed by chemical vapor deposition using silane-based gas can be used as the insulating layer. Further, a laminated film of the silicon oxide layer formed by the chemical vapor deposition using silane-based gas and a nitrogen-containing layer may be used as the insulating layer. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
申请公布号 |
JP2009004741(A) |
申请公布日期 |
2009.01.08 |
申请号 |
JP20080107747 |
申请日期 |
2008.04.17 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;ONUMA HIDETO |
分类号 |
H01L21/02;H01L21/336;H01L21/762;H01L27/12;H01L29/786 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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