| 摘要 |
A probe tip with cantilever structure having support bumper of pillar or cylinder is provided to improve durability, contact reliability, and spatial utilization by arranging a plurality of cantilever arms. A probe tip(1) with cantilever structure inspects an electrical property of machinery and apparatus, and comprises a center bumper(11), two or more cantilever arms(12), and a contact tip(121). The cantilever arm is combined according to an exterior of the center bumper. The contact tip is extended and is protruded downward from the cantilever arm. The center bumper, the cantilever arm, or the contact tip has a cross section of a wide top narrow bottom. The cantilever arm or the contact tip is made of an elastic material. |
