| 摘要 |
<p>The invention relates to a method for detecting a defective data sequence on a storage medium, wherein the data sequence contains a plurality of bits, including data bits and redundancy bits, and further relates to a method for testing a storage medium. The invention furthermore relates to a device for detecting a defective data sequence on a storage medium. In order to reduce the usually necessary two accesses to a storage medium for reading out a data sequence, i.e. once for reading out the data bits and once for reading out the redundancy bits of the data sequence, to a single access, it is provided according to the invention that the total number (nd + nr) of bits in a data sequence, comprising nd data bits and nr redundancy bits, can be reduced to a data bus width that is identical to nd or smaller than nd so that if the expectation value of the data is known, each single-bit error can be localised and each multi-bit error can be detected and distinguished from single-bit errors. An advantage of the invention is that the read-out of data sequences from a storage medium for the purpose of testing is thereby reduced from respectively two to one read access without loss of test coverage.</p> |
