发明名称 |
SCAN TYPE LASER PROCESSING APPARATUS HAVING MEASURING UNIT |
摘要 |
A scan type laser processing apparatus for accurately analyzing the processing result of the specimen processed by the laser beam is provided. A scan type laser processing apparatus using the laser beam comprises a light source(110) irradiating the laser beam; a scanner(120) changing the progressive direction and incident angle of the laser beam; a first optic(130) focusing the laser beam provided from scanner on specimen; an aperture(160) selecting the scattering signal corresponding to the corresponding incident laser beam from a plurality of scattering signals emitted in the majority area of the specimen(150); and a measuring unit(200) measuring the processed information of specimen with the scattering signal. |
申请公布号 |
KR20080111606(A) |
申请公布日期 |
2008.12.24 |
申请号 |
KR20070059752 |
申请日期 |
2007.06.19 |
申请人 |
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY |
发明人 |
HAHN, JAE WON |
分类号 |
B23K26/03;B23K26/00;B23K26/60 |
主分类号 |
B23K26/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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