发明名称 SCAN TYPE LASER PROCESSING APPARATUS HAVING MEASURING UNIT
摘要 A scan type laser processing apparatus for accurately analyzing the processing result of the specimen processed by the laser beam is provided. A scan type laser processing apparatus using the laser beam comprises a light source(110) irradiating the laser beam; a scanner(120) changing the progressive direction and incident angle of the laser beam; a first optic(130) focusing the laser beam provided from scanner on specimen; an aperture(160) selecting the scattering signal corresponding to the corresponding incident laser beam from a plurality of scattering signals emitted in the majority area of the specimen(150); and a measuring unit(200) measuring the processed information of specimen with the scattering signal.
申请公布号 KR20080111606(A) 申请公布日期 2008.12.24
申请号 KR20070059752 申请日期 2007.06.19
申请人 INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY 发明人 HAHN, JAE WON
分类号 B23K26/03;B23K26/00;B23K26/60 主分类号 B23K26/03
代理机构 代理人
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