SCREENING OF SILICON WAFERS USED IN PHOTOVOLTAICS

摘要

A method for screening silicon-based wafers (104, 106) used in the photovoltaic industry (110) is provided herewith. The wafers (104, 106) are placed on a conveyor belt (102), which carries the wafers through an illumination zone (112), and wherein each wafer receives a beam of light. Wafers having fatal cracks (114) may break as a result of the thermal stress, and so may be eliminated from further processing.