发明名称 |
APPARATUS FOR CHEMICAL MECHANICAL POLISHING |
摘要 |
Chemical mechanical polishing equipment is provided to improve the product yield by preventing a chemical mechanical polishing process from being abnormally performed due to separation of a conditioner head. Chemical mechanical polishing equipment comprises a platen(120) and a first polishing pad(130) for covering the upper portion of the platen. A second polishing pad(140) presses a wafer(W) above the first polishing pad so that the wafer is polished by the first polishing pad. A pad conditioner(150) has a conditioner head(152) for sweeping at one side of the first polishing pad while polishing the surface of the first polishing pad by a predetermined level. A clean cup(160) is formed at one side of the platen to clean the conditioner head. A sensor(170) detects if the conditioner head is separated from the pad conditioner. A controller determines if the conditioner head is separated from the pad conditioner based on a detection signal from the sensor and outputs an interlock control signal according to the determination result. |
申请公布号 |
KR20080086014(A) |
申请公布日期 |
2008.09.25 |
申请号 |
KR20070027557 |
申请日期 |
2007.03.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YOUNG HUN |
分类号 |
B24B37/04;B24B53/017;H01L21/304 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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