发明名称 APPARATUS FOR CHEMICAL MECHANICAL POLISHING
摘要 Chemical mechanical polishing equipment is provided to improve the product yield by preventing a chemical mechanical polishing process from being abnormally performed due to separation of a conditioner head. Chemical mechanical polishing equipment comprises a platen(120) and a first polishing pad(130) for covering the upper portion of the platen. A second polishing pad(140) presses a wafer(W) above the first polishing pad so that the wafer is polished by the first polishing pad. A pad conditioner(150) has a conditioner head(152) for sweeping at one side of the first polishing pad while polishing the surface of the first polishing pad by a predetermined level. A clean cup(160) is formed at one side of the platen to clean the conditioner head. A sensor(170) detects if the conditioner head is separated from the pad conditioner. A controller determines if the conditioner head is separated from the pad conditioner based on a detection signal from the sensor and outputs an interlock control signal according to the determination result.
申请公布号 KR20080086014(A) 申请公布日期 2008.09.25
申请号 KR20070027557 申请日期 2007.03.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YOUNG HUN
分类号 B24B37/04;B24B53/017;H01L21/304 主分类号 B24B37/04
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