发明名称 METHOD FOR FORMING TRENCH AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
摘要 A method for forming a trench includes providing a substrate, and forming the trench in the substrate using a gas containing chlorine (Cl<SUB>2</SUB>) gas as a main etch gas and SiF<SUB>X </SUB>gas as an additive gas, wherein a sidewall of the trench has a substantially vertical profile by virtue of reaction of the Cl<SUB>2 </SUB>gas and the SiF<SUB>X </SUB>gas.
申请公布号 US2008233758(A1) 申请公布日期 2008.09.25
申请号 US20070948676 申请日期 2007.11.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG TAE-WOO
分类号 H01L21/306 主分类号 H01L21/306
代理机构 代理人
主权项
地址