| 摘要 |
<p>A novel information system for optimizing a phase in the lifespan of a probe card for semiconductor wafer testing, by receiving, storing, and disseminating probe card data over a network between customer and supplier. The system optimizes the ordering of a probe card by a customer, the manufacture of the probe card by a supplier, and the performance and repair of the probe card during its lifespan. The information system includes a server that receives, stores, and disseminates historical information gathered during the order, manufacture, performance, and repair phases of probe cards. A server application receives current information from a probe card customer or supplier, calculates metrics based on this information, compares the metric to previously recorded historical data, and communicates the results of the comparison and the historical data to a system user.</p> |
