发明名称 |
INTERMEDIATE PROBE STRUCTURES FOR ATOMIC FORCE MICROSCOPY |
摘要 |
An intermediate probe structure for atomic force microscopy is disclosed. The probe structure comprises a semiconductor substrate with one or more moulds formed on a surface of one side of the substrate. The probe structure further comprises one or more probe configurations formed on the one side of the semiconductor substrate, wherein each probe configuration comprises a contact region and at least one set of a probe tip and a cantilever. The probe structure further comprises one or more holders attached to each of the contact regions, wherein the surface area of each contact region is smaller in size than the surface area of the holder which is attached to the contact region.
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申请公布号 |
US2008230856(A1) |
申请公布日期 |
2008.09.25 |
申请号 |
US20070775183 |
申请日期 |
2007.07.09 |
申请人 |
INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)VZW |
发明人 |
FOUCHIER MARC |
分类号 |
H01L29/84;G01Q30/20;G01Q60/24;G01Q60/38;G01Q70/06;G01Q70/16;G01R1/073 |
主分类号 |
H01L29/84 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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