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经营范围
发明名称
Apparatus and Method for Inspecting a Defect
摘要
申请公布号
KR100945444(B1)
申请公布日期
2010.03.05
申请号
KR20080032069
申请日期
2008.04.07
申请人
发明人
分类号
H04N17/02;H04N17/00
主分类号
H04N17/02
代理机构
代理人
主权项
地址
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