发明名称 Multi-marked diploid yeast strains for use in measuring eukaryotic chromosome instability
摘要 The present invention concerns a method for measuring chromosome instability as well as a diploid or polyploid yeast strain suitable for carrying out such a method. The method according to the invention allows detecting chromosome break events with a greatly improved sensitivity. In addition, it also allows detecting chromosome loss events. The method according to the invention is for example useful for evaluating toxicity of pharmaceutical and/or dietary compounds.
申请公布号 EP2184365(A1) 申请公布日期 2010.05.12
申请号 EP20080305778 申请日期 2008.11.05
申请人 CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE- CNRS 发明人 DIRICK, LEON
分类号 C12N15/90 主分类号 C12N15/90
代理机构 代理人
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