| 摘要 |
Systems and methods for testing an integrated circuit device using transmission path and charged device model electrostatic discharge testing. The method includes measuring a electrostatic discharge signal (152) from a charged transmission path (56) of the system (10), measuring a electrostatic discharge signal (162) from the charged transmission path (56) of the system (10) and a charged integrated circuit device (12) coupled with the charged transmission path (56), and determining a charged device model waveform (182) based upon distinctions between these electrostatic discharge signals (152, 162).
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