发明名称 |
FLUORINATED MONOMER OF CYCLIC ACETAL STRUCTURE, POLYMER, RESIST PROTECTIVE COATING COMPOSITION, RESIST COMPOSITION, AND PATTERNING PROCESS |
摘要 |
PURPOSE: A monomer containing fluorine, with cyclic acetal structure is provided to ensure transparency and water repellent ability against radiation of under 20nm of wave length. CONSTITUTION: A monomer containing fluorine with cyclic acetal structure is denoted by chemical formula 1. A polymeric unsaturated group of the monomer comprises acrylic acid ester, methacrylic acid ester, or alpha-trifluoromethyl acerylic acid ester. A resist protective film material contains a polymer compound having repetitive unit of chemical formula 6. The resist protective film material additionally comprises solvent. A method for forming patterns comprises: a process of applying the resist material on a substrate; a process of forming the resist protective film on a photoresist film using the resist protective film material; a process of inserting liquid between transparent lens and wafer and exposing light through a photo mask; and a step of developing.
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申请公布号 |
KR20100048912(A) |
申请公布日期 |
2010.05.11 |
申请号 |
KR20090103378 |
申请日期 |
2009.10.29 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
WATANABE TAKERU;SHINACHI SATOSHI;KINSHO TAKESHI;HASEGAWA KOJI;HARADA YUJI;HATAKEYAMA JUN;MAEDA KAZUNORI;KOBAYASHI TOMOHIRO |
分类号 |
C07D307/10;C07D309/02;C07D319/06 |
主分类号 |
C07D307/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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