发明名称 Trenched mosfets with improved gate-drain (GD) clamp diodes
摘要 A method for operating a semiconductor power device by in a forward conducting mode instead of an avalanche mode during a voltage fly-back during an inductive switch operation for absorbing a transient energy with less stress. The method includes a step of clamping the semiconductor power device with a Zener diode connected between a gate metal and a drain metal of the semiconductor power device to function as a gate-drain (GD) clamp diode with the GD clamp diode having an avalanche voltage lower than a source/drain avalanche voltage of the semiconductor power device whereby as the voltage fly-back inducing a drain voltage increase rapidly reaching the avalanche voltage of the GD clamp diode for generating the forward conducting mode.
申请公布号 US2009219657(A1) 申请公布日期 2009.09.03
申请号 US20090383247 申请日期 2009.03.19
申请人 FORCE-MOS TECHNOLOGY CORPORATION 发明人 HSHIEH FWU-IUAN
分类号 H02H9/00 主分类号 H02H9/00
代理机构 代理人
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