发明名称 SEMICONDUCTOR TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor testing device of a network license system which is usable without lowering production efficiency/test efficiency. SOLUTION: This semiconductor testing device for performing license management by the network license system is provided with a restricted function utilization discrimination means for discriminating test debugging and a continuous test function of a semiconductor as utilization of a restricted function of a license management object, and a license security state erection confirmation means for asking a license using state to a license server at the point of time when each test unit is finished during execution of a test function discriminated by the restricted function utilization discrimination means. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009198291(A) 申请公布日期 2009.09.03
申请号 JP20080039803 申请日期 2008.02.21
申请人 YOKOGAWA ELECTRIC CORP 发明人 ANZAI SADASHIGE
分类号 G01R31/28 主分类号 G01R31/28
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