| 摘要 |
The invention relates to a method and an apparatus for the investigation of a sample material by multiple sample light spots (501) generated by evanescent waves. An array of source light spots (510) is generated by a multi-spot generator, e.g. a multi-mode interferometer (106), and mapped onto sample light spots (501) in a sample layer (302) by (micro-)lenses (202, 203) or by the Talbot effect. The input light (504) of the source light spots (510) is shaped such that all of it is totally internally reflected at the interface between a transparent carrier plate (301) and the sample layer (302). Thus the sample light spots (501) consist of evanescent waves only and are restricted to a limited volume. In a preferred application, fluorescence stimulated in the sample light spots (501) is detected with spatial resolution by a CCD array (401).
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