发明名称 SEMICONDUCTOR MEMORY APPARATUS FOR GUARANTEEING RELIABLITY OF DATA TRANSMISSION
摘要 A semiconductor memory device for securing reliability of data delivery is provided to enhance reliability of data distorted in an input/output process by outputting a data strobe signal for not only data outputted according to a read command but also data for CRC(Cyclic Redundancy Check) through a pin which outputs an EDC(Error Detection Code) according to an operation mode. A semiconductor memory device includes a pin for outputting data for a CRC for an error check. The data for the CRC is outputted according to an operation mode through the pin. A data strobe signal is outputted with data outputted according to a read command. A data(D0~D7) for the CRC for a write operation in a write error check mode is outputted when an error check mode among the operation mode is performed through the pin. A data for the CRC is outputted for a read operation in a read error check mode. A pattern data set in a mode register is outputted in a standby state among the error check mode.
申请公布号 KR20090093512(A) 申请公布日期 2009.09.02
申请号 KR20080019067 申请日期 2008.02.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN, BEOM JU;YOON, SANG SIK
分类号 G11C29/42 主分类号 G11C29/42
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