发明名称 |
SEMICONDUCTOR MEMORY APPARATUS FOR GUARANTEEING RELIABLITY OF DATA TRANSMISSION |
摘要 |
A semiconductor memory device for securing reliability of data delivery is provided to enhance reliability of data distorted in an input/output process by outputting a data strobe signal for not only data outputted according to a read command but also data for CRC(Cyclic Redundancy Check) through a pin which outputs an EDC(Error Detection Code) according to an operation mode. A semiconductor memory device includes a pin for outputting data for a CRC for an error check. The data for the CRC is outputted according to an operation mode through the pin. A data strobe signal is outputted with data outputted according to a read command. A data(D0~D7) for the CRC for a write operation in a write error check mode is outputted when an error check mode among the operation mode is performed through the pin. A data for the CRC is outputted for a read operation in a read error check mode. A pattern data set in a mode register is outputted in a standby state among the error check mode.
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申请公布号 |
KR20090093512(A) |
申请公布日期 |
2009.09.02 |
申请号 |
KR20080019067 |
申请日期 |
2008.02.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
SHIN, BEOM JU;YOON, SANG SIK |
分类号 |
G11C29/42 |
主分类号 |
G11C29/42 |
代理机构 |
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主权项 |
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