| 摘要 |
PROBLEM TO BE SOLVED: To provide a double refraction measuring device capable of measuring a double refraction characteristic of a measuring sample having a non-planar shape such as a lens. SOLUTION: A light beam emitted from a light source 2 is allowed to enter a desired position on a measuring sample 7 having a non-planar shape via a polarizer 3. Since each position and angle of an analyzer 16 and a detector 17 can be changed corresponding to an emission angle of the light beam B from the measuring sample 7, even if the light beam is greatly refracted by the measuring sample 7, the light beam B transmitted through the measuring sample 7 can be allowed to enter properly the detector 17 through the analyzer 16, to thereby measure the double refraction characteristic of the measuring sample 7 having the non-planar shape. COPYRIGHT: (C)2011,JPO&INPIT |
