发明名称 MARK FORMING METHOD, MARK READING METHOD, MARK DRAWING APPARATUS AND MARK READING APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for applying information to a mark, without having to change the external appearance of the mark. <P>SOLUTION: Deformed marks from E mark 8 to O mark 13, in which a basic form of a company mark 4 is at least partially deformed, and information corresponding to each of the marks, are stored in a mark storage unit; a deformed mark selection unit includes a deformed mark selection step of performing operation for extracting the deformed mark from the mark storage unit, according to the information applied to the company mark 4; and a mark drawing step of drawing the deformed mark extracted by a semiconductor device 1. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011113250(A) 申请公布日期 2011.06.09
申请号 JP20090268450 申请日期 2009.11.26
申请人 SEIKO EPSON CORP 发明人 KOYAMA MINORU
分类号 G06K19/06;G06K7/10;H01L23/00 主分类号 G06K19/06
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