发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device which miniaturizes each memory cell while suppressing degradation of a characteristic of the semiconductor memory device. SOLUTION: The semiconductor memory device includes: a substrate 101; gate insulating films 111 formed on the substrate and each functioning as an FN (Fowler-Nordheim) tunneling film; first floating gates 112 formed on the gate insulating films; first inter-gate insulating films 113 formed on the first floating gates and each functioning as an FN tunneling film; second floating gates 114 formed on the first inter-gate insulating films; a second inter-gate insulating film 115 formed on the second floating gates and functioning as a charge blocking film; and a control gate 116 formed on the second inter-gate insulating film. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011114034(A) |
申请公布日期 |
2011.06.09 |
申请号 |
JP20090266591 |
申请日期 |
2009.11.24 |
申请人 |
TOSHIBA CORP |
发明人 |
IZUMIDA TAKASHI;KUSAKA TOMOMI;KONDO MASAKI;AOKI NOBUTOSHI |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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