发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory device which miniaturizes each memory cell while suppressing degradation of a characteristic of the semiconductor memory device. SOLUTION: The semiconductor memory device includes: a substrate 101; gate insulating films 111 formed on the substrate and each functioning as an FN (Fowler-Nordheim) tunneling film; first floating gates 112 formed on the gate insulating films; first inter-gate insulating films 113 formed on the first floating gates and each functioning as an FN tunneling film; second floating gates 114 formed on the first inter-gate insulating films; a second inter-gate insulating film 115 formed on the second floating gates and functioning as a charge blocking film; and a control gate 116 formed on the second inter-gate insulating film. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011114034(A) 申请公布日期 2011.06.09
申请号 JP20090266591 申请日期 2009.11.24
申请人 TOSHIBA CORP 发明人 IZUMIDA TAKASHI;KUSAKA TOMOMI;KONDO MASAKI;AOKI NOBUTOSHI
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
代理机构 代理人
主权项
地址