发明名称 APPARATUS, METHOD AND PROGRAM FOR TESTING PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a program testing apparatus to test a program under programmable conditions. SOLUTION: A program to be tested input from an input part is divided into a plurality of modules. Information on each module and variable information used in each module are obtained by analysis. Information on a function to be implemented by each module is acquired from the input part and added to the information on the module to form module information. The module information and variable information are used to generate a test input screen for input of test logic necessary for a program test of each module from the input part. A test program generated from the test logic input on the test input screen is executed, and test results are stored in a test database. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011113277(A) 申请公布日期 2011.06.09
申请号 JP20090268772 申请日期 2009.11.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKAGAWA KOICHI
分类号 G05B19/05;G05B19/048;G05B23/02;G06F11/28 主分类号 G05B19/05
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