发明名称 THERMAL ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a thermal analysis device using a MEMS-based sensor advantageous for the analysis of small samples or extreme thermal processes. SOLUTION: The thermal analysis device includes a replaceable sensor 19, that can be contacted via a contact element 23 of electrical contacting means, a heating element 14, and a cooling element 20. The contact element(s) 23 is thermally connected to the heating element 14 and can be heated, independently of the operating state of the cooling element 20, even when a sensor 19 is not mounted in the device. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011112646(A) 申请公布日期 2011.06.09
申请号 JP20100255670 申请日期 2010.11.16
申请人 METTLER-TOLEDO AG 发明人 SCHAERER CORINNE;ESER ULRICH;HUETTER THOMAS
分类号 G01N25/18;G01N25/20 主分类号 G01N25/18
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