发明名称 PROBE UNIT TESTING MICRO PITCH ARRAY
摘要 PURPOSE: A probe unit for testing an ultra fine pitch is provided to stably contact each row of a contact unit with an object even though the contact unit of a probe sheet is formed on two or more rows. CONSTITUTION: A probe sheet(230) forms contact unit in two or more rows by forming a pattern wiring on an insulation film. A body block(210) fixes the probe sheet. A pressing member(220) is formed on the body block and presses the contact unit toward the object. The pressing member independently presses each row.
申请公布号 KR101039338(B1) 申请公布日期 2011.06.08
申请号 KR20100121328 申请日期 2010.12.01
申请人 KODI-S CO., LTD. 发明人 KIM, HUN MIN
分类号 G01R1/073;G02F1/13;H01L21/66 主分类号 G01R1/073
代理机构 代理人
主权项
地址