发明名称 |
Semiconductor chip used in flip chip process |
摘要 |
A semiconductor chip for forming the same. The semiconductor chip includes M regular solder bump structures and N monitor solder bump structures, M and N being positive integers. If a flip chip process is performed for the semiconductor chip, then the N monitor solder bump structures are more sensitive to a cool-down stress than the M regular solder bump structures. The cool-down stress results from a cool-down step of the flip chip process. Each of the M regular solder bump structures is electrically connected to either a power supply or a device of the semiconductor chip. Each of the N monitor solder bump structures is not electrically connected to a power supply or a device of the semiconductor chip.
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申请公布号 |
US7851911(B2) |
申请公布日期 |
2010.12.14 |
申请号 |
US20100715523 |
申请日期 |
2010.03.02 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
CAREY CHARLES F.;HANSEN BERNT JULIUS;MALHOTRA ASHWANI K.;QUESTAD DAVID L.;SAUTER WOLFGANG |
分类号 |
H01L23/48;H01L23/52 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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