发明名称 Semiconductor device and method for fabricating the same
摘要 A method for fabricating a semiconductor device includes the steps of: forming a first insulating film on a semiconductor substrate; removing part of the first insulating film; forming a second insulating film having a leakage current density higher than that of the first insulating film on a region where the part of the first insulating film has been removed on the semiconductor substrate; forming an undoped semiconductor film on the first and second insulating films; implanting an impurity into part of the undoped semiconductor film, thereby defining semiconductor regions of a first conductivity type dotted as discrete islands; forming a third insulating film on the semiconductor regions of the first conductivity type and the undoped semiconductor film; and removing part of the third insulating film by wet etching. At least the second insulating film is formed under the semiconductor regions of the first conductivity type.
申请公布号 US7851891(B2) 申请公布日期 2010.12.14
申请号 US20090424894 申请日期 2009.04.16
申请人 PANASONIC CORPORATION 发明人 SENGOKU NAOHISA;MATSUMOTO MICHIKAZU
分类号 H01L27/04;H01L29/06;H01L21/822;H01L21/8234;H01L27/06;H01L27/088 主分类号 H01L27/04
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