PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTIONAL EDDY CURRENT PROBE

摘要

A method for testing a component using an eddy current array probe is provided. The method includes calibrating the eddy current array probe, collecting data from the eddy current array probe for analysis, and processing the collected data to at least one of compensate for response variations due to a detected orientation of a detected imperfection and to facilitate minimizing noise.