发明名称 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a photosensitive resin composition having high sensitivity and generating no residue on a pattern, a method for producing a cured relief pattern and a semiconductor device. <P>SOLUTION: The photosensitive resin composition for alkali development includes (a) 100 pts.mass of a polyamic acid, (b) 1-100 pts.mass of a compound represented by formula (1), and (c) 1-50 pts.mass of a photosensitizer, wherein R<SP>1</SP>and R<SP>2</SP>each independently represent H or a 1-10C organic group, provided that at least one of R<SP>1</SP>and R<SP>2</SP>is a &ge;6C organic group; and R<SP>3</SP>represents a &ge;1C organic group. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011022511(A) 申请公布日期 2011.02.03
申请号 JP20090169464 申请日期 2009.07.17
申请人 ASAHI KASEI E-MATERIALS CORP 发明人 SASAKI TAKAHIRO
分类号 G03F7/004;G03F7/023;G03F7/038;H01L21/027 主分类号 G03F7/004
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