发明名称 |
Filling Cavities in Semiconductor Structures |
摘要 |
High aspect ratio trenches may be filled with metal that grows more from the bottom than the top of the trench. As a result, the tendency to form seams or to close off the trench at the top during filling may be reduced in some embodiments. Material that encourages the growth of metal may be formed in the trench at the bottom, while leaving the region of the trench near the top free of such material to encourage growth upwardly from the bottom.
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申请公布号 |
US2012126415(A1) |
申请公布日期 |
2012.05.24 |
申请号 |
US20100948897 |
申请日期 |
2010.11.18 |
申请人 |
HAIMSON SHAI;ROZENBLAT AVI;HORVITZ DROR;ROTLAIN MAOR;DRORI ROTEM |
发明人 |
HAIMSON SHAI;ROZENBLAT AVI;HORVITZ DROR;ROTLAIN MAOR;DRORI ROTEM |
分类号 |
H01L23/48;H01L21/3205 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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