发明名称
摘要 PROBLEM TO BE SOLVED: To provide a film deposition system in which an evaporation rate of a material and plasma density are set freely, gas barrier properties can be set freely independently of a deposition rate and a gas barrier laminate excellent in oxygen barrier properties and water vapor barrier properties is produced. SOLUTION: The thin film deposition apparatus includes: a conveyance means for conveying a film base material by a roll-to-roll method; and a vapor deposition means for depositing the vapor of the material to be deposited onto the film base material. The vapor deposition means has a means for evaporating the material to be deposited and a means for activating the evaporated material to be deposited by plasma. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP5504720(B2) 申请公布日期 2014.05.28
申请号 JP20090165369 申请日期 2009.07.14
申请人 发明人
分类号 C23C14/32;B32B9/00;C23C14/08;C23C14/30;C23C14/56 主分类号 C23C14/32
代理机构 代理人
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