| 摘要 |
PROBLEM TO BE SOLVED: To provide a control device and control method for a semiconductor memory, which can suppress the degradation of the reliability of read data.SOLUTION: A provided method includes the steps of: setting all memory cells of a memory cell group comprising a plurality of memory cells, to the state of a first logic level; performing data write for shifting a desired memory cell in the memory cell group to the state of a second logic level; when obtaining a read data piece by performing data read from the memory cell group in response to a read instruction, detecting error bits by performing error detection processing to the read data piece; and determining that the read data piece is invalid data if the number of error bits having the above-described first logic level in the error bits detected from the read data piece is more than the number of error bits having the second logic level. |
