发明名称 |
REFLECTION TYPE MASK, EXPOSURE METHOD, AND METHOD OF MANUFACTURING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a reflection type mask with reduced damage even when thermal load is applied thereto.SOLUTION: The reflection type mask includes: a reflection layer 101 composed of a multilayer film for reflecting extreme-ultraviolet light; a substrate 100 for supporting the reflection layer; and a heat diffusion layer 104 for diffusing heat of the reflection layer, disposed between the reflection layer 101 and the substrate 100. A heat capacity per unit area of a structure constituted of the reflection layer 101 and the heat diffusion layer 104 is equal to or larger than 1.1(J/(K m)). |
申请公布号 |
JP2015018918(A) |
申请公布日期 |
2015.01.29 |
申请号 |
JP20130144855 |
申请日期 |
2013.07.10 |
申请人 |
CANON INC |
发明人 |
YONEKAWA MASAMI;MIYAKE AKIRA |
分类号 |
H01L21/027;G03F1/24 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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