发明名称 |
CHARGED-PARTICLE BEAM SYSTEM AND OPERATIONAL METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a charged-particle beam system that generates stable noble gas field ion beams.SOLUTION: The charged-particle beam system includes a noble gas field ion beam source, a charged-particle beam column and a housing defining a first vacuum region 10 and a second vacuum region 70. The noble gas field ion beam source is disposed inside the first vacuum region. A first mechanical vacuum pump 60 is connected with the first vacuum region, and an ion getter pump 56 is connected with the charged-particle beam column. A gas supply system is connected with the first vacuum region 10, and noble gas is supplied to the noble gas field ion beam source. |
申请公布号 |
JP2015018807(A) |
申请公布日期 |
2015.01.29 |
申请号 |
JP20140140043 |
申请日期 |
2014.07.07 |
申请人 |
CARL ZEISS MICROSCOPY LLC |
发明人 |
JOHN A NOTTE IV;ALEXANDER GROKHOLSKY;ROBERT CONNERS;MARK D DIMANNA;RAYMOND HILL |
分类号 |
H01J37/18;H01J27/26;H01J37/09;H01J37/16;H01J37/28;H01J37/317 |
主分类号 |
H01J37/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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