发明名称 CHARGED-PARTICLE BEAM SYSTEM AND OPERATIONAL METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a charged-particle beam system that generates stable noble gas field ion beams.SOLUTION: The charged-particle beam system includes a noble gas field ion beam source, a charged-particle beam column and a housing defining a first vacuum region 10 and a second vacuum region 70. The noble gas field ion beam source is disposed inside the first vacuum region. A first mechanical vacuum pump 60 is connected with the first vacuum region, and an ion getter pump 56 is connected with the charged-particle beam column. A gas supply system is connected with the first vacuum region 10, and noble gas is supplied to the noble gas field ion beam source.
申请公布号 JP2015018807(A) 申请公布日期 2015.01.29
申请号 JP20140140043 申请日期 2014.07.07
申请人 CARL ZEISS MICROSCOPY LLC 发明人 JOHN A NOTTE IV;ALEXANDER GROKHOLSKY;ROBERT CONNERS;MARK D DIMANNA;RAYMOND HILL
分类号 H01J37/18;H01J27/26;H01J37/09;H01J37/16;H01J37/28;H01J37/317 主分类号 H01J37/18
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