发明名称 半導体装置
摘要 <p>An object is to provide a semiconductor device of which a manufacturing process is not complicated and by which cost can be suppressed, by forming a thin film transistor using an oxide semiconductor film typified by zinc oxide, and a manufacturing method thereof. For the semiconductor device, a gate electrode is formed over a substrate; a gate insulating film is formed covering the gate electrode; an oxide semiconductor film is formed over the gate insulating film; and a first conductive film and a second conductive film are formed over the oxide semiconductor film. The oxide semiconductor film has at least a crystallized region in a channel region.</p>
申请公布号 JP5674905(B2) 申请公布日期 2015.02.25
申请号 JP20130242587 申请日期 2013.11.25
申请人 发明人
分类号 H01L29/786;G02F1/1368;G09F9/30;H01L21/20;H01L21/28;H01L21/336;H01L51/50 主分类号 H01L29/786
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